Ion-beam depth-profiling studies of leached glasses

Cathodoluminescence depth profiling of ion-implanted GaN

Molecular depth profiling with cluster ion beams.

Peptide-doped trehalose thin films have been characterized by bombardment with energetic cluster ion beams of C60+ and Aux+ (x = 1, 2, 3). The aim of these studies is to acquire information about the molecular sputtering process of the peptide and trehalose by measurement of secondary ion mass spectra during erosion. This system is important since uniform thin films of approximately 300 nm thic...

Dual beam organic depth profiling using large argon cluster ion beams

Argon cluster sputtering of an organic multilayer reference material consisting of two organic components, 4,4'-bis[N-(1-naphthyl-1-)-N-phenyl- amino]-biphenyl (NPB) and aluminium tris-(8-hydroxyquinolate) (Alq3), materials commonly used in organic light-emitting diodes industry, was carried out using time-of-flight SIMS in dual beam mode. The sample used in this study consists of a ∽400-nm-thi...

Electron Beam and Optical Depth Profiling of Quasibulk GaN

Software for Modelling Positron-Beam Depth-Profiling Data

The fitting program VEPFIT has been extended with applications running under the Microsoft Windows environment facilitating the input and output of the VEPFIT fitting module. We have exploited the Microsoft-Windowsm graphical users interface by making use of dialog windows, scrollbars, command buttons etc. The user communicates with the program simply by clicking and dragging with the mouse poi...